Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan

This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a measurement system analysis technique to assure a stable gage measurement that ensures consistent measurements during repeated tests under similar characteristics, conditions or parameters. The external pre-tester boards were used to test BPMU and DPS boards on three J750 Automated Test Equipments (J750 ATE). The external pre-tester boards were analyzed for improvement in three areas: their usage as an acceptance tool during manufacturing, reduction in testing time, and their ability to predict and foretell future bugs. The analysis have proven the application of the pre-tester boards as an acceptance tool and prediction of future bugs (with their ability to detect faulty channels based on GR&R test results), and 85% time reduction in detection of faulty channels. Time reduction improves productivity, and thus it can be said the external pre-tester boards have the potential to be adopted in high-volume electronics manufacturing.