Abstract
BiFe03 doped with E112O3 and La203 were prepared by the conventional solid state reactions method. The effect of La and Eu substitution for the studies on dielectric properties of Bii.x.yEuxLayFe03 samples (x=0.2; y= 0.1, 0.2) has been studied by performing x-ray diffraction (X-RD), scanning electron microscopy(SEM) and electrical impedance spectroscopy (EIS). The results of prepared samples are compared with pure BiFe03 and the single doping of Bii_xEuxFe03samples (x=0.1, 0.15, 0.2). Result showed that the grain size decreasing when the concentration of Bii.x.yEuxLayFe03 samples is increased. X-ray diffraction (XRD,) patterns showed that single phase was formed for all samples. The dielectric constant and the dielectric loss is decreasing as the as the frequency is increase from 1 kHz to 1 MHz at 30°C.
Metadata
Item Type: | Student Project |
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Creators: | Creators Email / ID Num. Mostapa Kamal, Munirah UNSPECIFIED |
Contributors: | Contribution Name Email / ID Num. UNSPECIFIED Ramli, Rosmamuhamadani UNSPECIFIED UNSPECIFIED Talari, Mahesh Kumar UNSPECIFIED |
Subjects: | Q Science > QC Physics > Electricity and magnetism > Dielectrics T Technology > TA Engineering. Civil engineering > Mechanics of engineering. Applied mechanics |
Divisions: | Universiti Teknologi MARA, Shah Alam > Faculty of Applied Sciences |
Programme: | Bachelor of Science (Hons.) Industrial Physics |
Keywords: | Microstructure, Dielectric, Diffraction |
Date: | 2012 |
URI: | https://ir.uitm.edu.my/id/eprint/44535 |
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