Abstract
The undoped amorphous carbon thin films were deposited on glass substrates by bias-assisted pyrolysis-CVD at various deposition temperatures in the range of 250⁰C-550⁰C. The electrical, optical and structural properties were characterized by using current voltage (I-V) measurement, UV-VIS/NIR spectrophotometer and Atomic Force Microscopy (AFM). The electrical conductivity of amorphous carbon thin films increased as the temperature increased. The highest and lowest photo responses were found at 350⁰C and 500⁰C, respectively. The highest absorption coefficient was found at the high temperature, 550⁰C. The AFM images showed that, density and uniformity have correlated with the resistivity and conductivity for undoped amorphous carbon thin films deposited at different temperatures.
Metadata
| Item Type: | Article |
|---|---|
| Creators: | Creators Email / ID Num. Ya’acob, Mohd Zulkanain 2010413146 |
| Subjects: | T Technology > TS Manufactures T Technology > TS Manufactures > Metal manufactures. Metalworking |
| Divisions: | Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering |
| Page Range: | pp. 1-5 |
| Keywords: | Chemical vapor deposition, Amorphous carbon, Palm oil, Thin films |
| Date: | 2013 |
| URI: | https://ir.uitm.edu.my/id/eprint/125113 |
