Memristive behavior of lateral metal-insulator-metal structured ZnO thin film

Osman, Norain (2013) Memristive behavior of lateral metal-insulator-metal structured ZnO thin film. [Student Project] (Unpublished)

Abstract

A sol gel spin coated Zinc Oxide (ZnO) based memristive device was fabricated and investigated for its memristive behavior. In this paper, the effect of spin speed and different structure of the memristor were studied. Two type of memristor structures were fabricated; vertical and lateral structures. In vertical structure, the ZnO layer was sandwiched between two Pt metal layers on the top and bottom, while in lateral structure, the ZnO layer was sandwiched by Pt metal layers on both sides, to form the metalinsulator-metal (MIM) configuration of a typical memristor. Each structure was fabricated by sol-gel spin coating method while varying the spin speed from 2500 rpm to 3500 rpm. We found the suitable method to fabricate the lateral-MIM structure by which the resistive switching behavior of ZnO thin film was observed.

Metadata

Item Type:	Student Project
Creators:	Creators Email / ID Num. Osman, Norain UNSPECIFIED
Contributors:	Contribution Name Email / ID Num. Advisor Abu Bakar, Raudah UNSPECIFIED
Subjects:	T Technology > TA Engineering. Civil engineering T Technology > TA Engineering. Civil engineering > Building materials
Divisions:	Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering
Programme:	Bachelor of Engineering (Hons.) Electronic
Keywords:	Metalinsulator-Metal (MIM), Zinc Oxide (ZnO), Field Emission Scanning Electron Microscope (FESEM), Atomic Force Microscopy (AFM)
Date:	2013
URI:	https://ir.uitm.edu.my/id/eprint/122699