Design and simulation of 65nm vertical double gate NMOS using Silvaco TCAD tools / Mohd Ridzuan Mohd Nayin @ Mohd Nayan

Mohd Nayin @ Mohd Nayan, Mohd Ridzuan (2009) Design and simulation of 65nm vertical double gate NMOS using Silvaco TCAD tools / Mohd Ridzuan Mohd Nayin @ Mohd Nayan. Degree thesis, Universiti Teknologi MARA (UiTM).

Abstract

This paper has demonstrated structure design and simulating electrical characteristic of Vertical Double Gate n-channel MOSFET (NMOS) using Silvaco TCAD Tools. Objectives of this study are to design 65nm Vertical NMOS, meet the specification provided by International Technology Roadmap Semiconductor (ITRS) and to study the effect threshold voltage by varying body channel doping and oxide thickness. The investigation of Vertical NMOS characteristic is done through structure design and simulation electrical characteristic using ATLAS tools Silvaco. The extracted values are compared to the ITRS specification. At gate length, Lg=65nm, channel body doping concentration of 1.5×1018 cm-3 and oxide thickness, Tox=2.2 nm, this design have a drive current of 450µA/µm, low off-state leakage at 18.14nA/µm and subthreshold swing, SubVt of 76mV/decade. From Id versus Vgs characteristic curve, threshold voltage is 0.19V at Vds=0.1V.

Metadata

Item Type: Thesis (Degree)
Creators:
Creators
Email / ID Num.
Mohd Nayin @ Mohd Nayan, Mohd Ridzuan
UNSPECIFIED
Contributors:
Contribution
Name
Email / ID Num.
Thesis advisor
Shariffudin, Shafinaz Sobihana
UNSPECIFIED
Thesis advisor
Radzali, Rosfariza
UNSPECIFIED
Subjects: T Technology > TK Electrical engineering. Electronics. Nuclear engineering > Electric power distribution. Electric power transmission
T Technology > TK Electrical engineering. Electronics. Nuclear engineering > Electronics > Apparatus and materials > Semiconductors
Divisions: Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering
Programme: Bachelor of Electrical Engineering (Honours)
Keywords: NMOS, Silvaco TCAD tools, semiconductor
Date: 2009
URI: https://ir.uitm.edu.my/id/eprint/115427
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