Abstract
Tin Oxide (SnO2) is an n type semiconductor with direct band gap of 3.6eV. It is highly conducting, transparent and sensitive to gases. The energy band gap is one of the important parameter of SnO2. This work was to characterize the optical properties of SnO2 with different annealing temperature. The thin films of SnO2 doped with AI2O3 was deposited by electrospinning method on the glass substrates. The thin films were annealed at 100°C, 200°C, 300°C, 400°C, 500°C then the optical and physical were investigated. Structural and morphological analysis were carried out by X-Ray Diffraction (XRD) measurement and Microscope. The optical characteristics were analyzed by UV-Vis Spectrophotometer. As annealing temperature increases, optical transmission increase too, this due to the increase in film homogeneity and degree of crystallinity of the film. The increase the temperature lead to decrease in absorption values.
Metadata
Item Type: | Student Project |
---|---|
Creators: | Creators Email / ID Num. Mohd Zani, Muhammad Nizar Aiman UNSPECIFIED |
Contributors: | Contribution Name Email / ID Num. Thesis advisor Mohamad Saad, Puteri Sarah UNSPECIFIED |
Subjects: | T Technology > TA Engineering. Civil engineering > Materials of engineering and construction |
Divisions: | Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering |
Programme: | Bachelor of Engineering (Hons) Electronics Engineering |
Keywords: | Tin oxide, crystallinity, oxide semiconductors |
Date: | 2019 |
URI: | https://ir.uitm.edu.my/id/eprint/102901 |
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