Ahmad, Nor Asmah
(2007)
On wafer probing of monolithic microwave integrated circuit capacitors / Nor Asmah Ahmad.
Degree thesis, Universiti Teknologi MARA (UiTM).
Abstract
The purpose of this project is to measure capacitor on silicon wafer using Cascade's probe. The wafer will be measured using the RF probing technique. This project also will design the interdigital capacitor which focuses on the simulation with different length and width. The silicon has been used as a substrate with Er = 11.7 and thickness=300μm. The circuits were simulated using CAD packages.
Item Details
| Item Type: | Thesis (Degree) |
|---|---|
| Creators: | Creators Email / ID Num. Ahmad, Nor Asmah UNSPECIFIED |
| Contributors: | Contribution Name Email / ID Num. Thesis advisor Awang, Zaiki UNSPECIFIED |
| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering > Electronics > Microwaves. Including microwave circuits |
| Divisions: | Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering |
| Programme: | Bachelor of Electrical Engineering (Hons) |
| Keywords: | Capacitor, silicon wafer, microwave integrated circuit |
| Date: | 2007 |
| URI: | https://ir.uitm.edu.my/id/eprint/81109 |
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