Abstract
This paper discusses issues of power quality in general, and voltage dips in particular. Voltage dips is one of the major power quality problems for users of electrical energy causing sensitive equipments like Adjustable Speed Drive (ASD) and process control equipments to malfunction Investigation into the causes of voltage dips and their impact on the performance of ASD during voltage dips, looking into different possibilities to reduce the problems caused by voltage dips and methods to improve the performance of ASD during voltage dips are discussed in this paper. The main focus of the study is the redesign of ASD by introducing boost converter in the system without any additional energy storage devices. A case study has been performed at the Filrexbercham Industry in Ipoh, where voltage dips causes problems, Different values of voltage dips and boost converters were simulated using the simulation program MATLAB/Power System Blockset. The simulation results presented shows that boost converters provide ride-through to critical ASD loads during voltage dips as well as an improvement in the power quality.
Metadata
Item Type: | Conference or Workshop Item (Paper) |
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Creators: | Creators Email / ID Num. N, Perumal perumal@petronas.com.my Amir Hamzah, Mohammad Afzan Lexzonaus_1398@hotmail.com |
Subjects: | Q Science > QC Physics > Electricity and magnetism > Electricity > Electric current (General) T Technology > TK Electrical engineering. Electronics. Nuclear engineering > Electric power distribution. Electric power transmission T Technology > TK Electrical engineering. Electronics. Nuclear engineering > Electric apparatus and materials. Electric circuits. Electric networks |
Divisions: | Universiti Teknologi MARA, Pahang > Jengka Campus |
Event Title: | STSS 2004 : SAINS TEKNOLOGI JILID 1 |
Event Dates: | 31 MEI – 1 JUN 2004 |
Page Range: | pp. 335-343 |
Keywords: | Index Term-power quality, Voltage dip, Adjustable Speed Drive, Ride-through, Per-unit (p.u) |
Date: | 2004 |
URI: | https://ir.uitm.edu.my/id/eprint/52682 |