Abstract
In recent years, owing to its unique properties, ZnO has been researched extensively for a wide range of applications including sensors, transistors and solar cells. In this work, ZnO thin film doped with sodium (ZnO:Na) was characterized using Field Emission-Scanning Electron Microscopy (FESEM) and Energy Dispersive X-Ray Spectroscopy (EDX). The FESEM image of the ZnO:Na film implies crystal growth at different orientations. The surface composition of the ZnO :Na film with approximately 350 nm thickness was investigated by EDX as a function of accelerating voltage ranging from 5 kV to 15 kV. The EDX spectra revealed that 7 kV is the most appropriate accelerating voltage for extracting elemental composition of the ZnO:Na films, which exclude the detection of the underlying substrate elements. A rectifying structure made up of P-type ZnO :Na film and N-type tin doped indium oxide (ITO) film showed typical rectifying characteristic.
Metadata
| Item Type: | Article |
|---|---|
| Creators: | Creators Email / ID Num. Wen, Benedict Cheun Au UNSPECIFIED Kah, Yoong Chan kychan@mmu.edu.my Siow, Woon Ng UNSPECIFIED Fong, Kwong Yam UNSPECIFIED |
| Subjects: | Q Science > QC Physics > Heat > Temperature T Technology > T Technology (General) T Technology > TP Chemical technology |
| Divisions: | Universiti Teknologi MARA, Pahang > Jengka Campus |
| Journal or Publication Title: | Gading Journal for Science and Technology |
| UiTM Journal Collections: | UiTM Journal > Gading Journal of Science and Technology (GADINGS&T) |
| ISSN: | 2637-0018 |
| Volume: | 1 |
| Number: | 1 |
| Page Range: | pp. 1-6 |
| Keywords: | P-type ZnO:Na film, EDX accelerating voltage, FESEM, rectifying structure |
| Date: | 2018 |
| URI: | https://ir.uitm.edu.my/id/eprint/31335 |
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