Abstract
This thesis focuses on the effect of annealing temperature to electrical, structural and optical properties of deposited Zinc oxide (ZnO) thin films. ZnO solutions are deposited onto glass and silicon substrates using sol-gel spin coating technique. Deposited films are annealed at various temperatures from 300°C to 500°C. The electrical properties characterized by Current-Voltage (I-V) measurement shows that the resistivity decreased as annealing temperature increased. The structural properties are characterized using Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). SEM and XRD analysis indicated denser surface morphology and better crystallinity at higher temperature. The optical properties characterized by UV- spectrophotometer (UV-vis) indicated the transmittance is over 40% in the visible region range from 400 to 800nm and fully absorption at 300nm.
Metadata
Item Type: | Article |
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Creators: | Creators Email / ID Num. Abd Halim, Aisha Adibah UNSPECIFIED |
Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering |
Divisions: | Universiti Teknologi MARA, Shah Alam > Faculty of Electrical Engineering |
Page Range: | pp. 1-7 |
Keywords: | Zinc Oxide (ZnO); sol gel; thin film; spin coating; IV measurement. |
Date: | May 2008 |
URI: | https://ir.uitm.edu.my/id/eprint/114027 |