Analysis of silicon dioxide and silicon nitride anti reflection coating for silicon solar cell: article / Hairil Huzairi Abd Hamid

In this research, the analysis of silicon dioxide and silicon nitride for single and double layer thin film coatings on the reflectance spectrum of silicon surfaces has been investigate. The research has been carried out using ATLAS device simulator by Silvaco. This research is focusing to obtained higher efficiency and lower reflectance by different wavelength, thickness and refractive index. The material used for AR coating also important to give the lowest reflection in improving the efficiency. The ratio of available photocurrent is often known as external quantum efficiency. The source photocurrent is the amount of current generated by the light source and the available photocurrent is the amount semiconductor. of the current absorbed by By comparing the plot of spectrum response and the reflectance of analysis with and without AR coating, solar cell with ARC is more efficient With this analysis it was concluded that the effect of the wavelength, refractive index and the thickness of the material will be affected to the efficiency and the reflectance coating.