Items where Author is "Md Kamal, Nadia"

Measurement of dielectric constant of silicon wafer using microwave non-destrictive testing and direct current technique / Nadia Md Kamal. (2010) Degree thesis, thesis, Universiti Teknologi MARA (UiTM).

Measurement of dielectric constant of silicon wafer using microwave non-destrictive testing and direct current technique: article / Nadia Md Kamal. (2010) pp. 1-6.