Microstructure and the dielectric properties of Eu and Co CO-DOPED BiFeQ3 / Tuan Syarifah Nurul Hanani Syed Ahmad

Syed Ahmad, Tuan Syarifah Nurul Hanani (2012) Microstructure and the dielectric properties of Eu and Co CO-DOPED BiFeQ3 / Tuan Syarifah Nurul Hanani Syed Ahmad. [Student Project] (Unpublished)

Abstract

Pure BiFe03, Eu doped BiFeOs, and Eu and Co co-doped BiFe03. The BiFe03, Bii.xEuxFe03 and Bii.xEuxFei.yCoy03 were successfully prepared by solid state reaction method with (x = 0.1, 0.15, 0.2 and y = 0.1, 0.15). The effects of the doped and co-doped was studies on dielectric properties of BiFe03, Bii_xEuxFe03 and Bii_ xEuxFei.yCoy03 samples have been studied by performing x-ray diffraction (XRD), scanning electron microscopy (SEM) and dielectric measurement by electrical impedance spectroscopy (EIS). The results of the samples Bii.xEuxFe03 and Bij. xEuxFei.yCoy03 are compared to the pure bismuth ferrite (BiFeOs). XRD results confirm the formation of BiFe03 as major phase with secondary phase when codoped with Co. The SEM indicated that the sizes of the crystalline of the samples were decreased with increases of concentrations of the Eu and Co doped in the samples. Co-doping of the sample is smallest crystalline size and the pure sample is the most large crystalline size except for the y = 0.1. Dielectric measurement is done for all the samples. The low frequency dielectric constant and dielectric loss of samples decreases with increase in frequency. The sample of codoping Eu and Co in BiFe03 showed largest dielectric constant and smallest dielectric loss values compared to the pure BiFe03.

Metadata

Item Type: Student Project
Creators:
Creators
Email / ID Num.
Syed Ahmad, Tuan Syarifah Nurul Hanani
UNSPECIFIED
Contributors:
Contribution
Name
Email / ID Num.
Thesis advisor
Ramli, Rosmamuhamadani
UNSPECIFIED
Subjects: Q Science > QC Physics > Electricity and magnetism > Dielectrics
Divisions: Universiti Teknologi MARA, Shah Alam > Faculty of Applied Sciences
Programme: Bachelor of Science (Hons.) Industrial Physics
Keywords: Microstructure, Electrical impedance spectroscopy (EIS), X-ray diffraction (XRD)
Date: 2012
URI: https://ir.uitm.edu.my/id/eprint/45883
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