Abstract
Crystalline silicon (c-Si) is the most commonly used material in solar photovoltaics (PV) due to its stability and availability. However, its high surface reflectivity causes significant optical losses, reducing overall solar cell efficiency. This study evaluates the effectiveness of five single-layer anti-reflective coating (ARC) materials (Silicon nitride, Silicon dioxide, Titanium dioxide, Aluminium oxide, and Zinc oxide) applied on planar c-Si surfaces with thickness of 200 μm. Using the Wafer Ray Tracer by PV Lighthouse, optical behavior was simulated, and the maximum photocurrent density (Jₘₐₓ) was calculated. Among all tested materials, ZnO achieved the lowest reflection and highest Jₘₐₓ of 35.84 mA/cm², representing a 40.05% enhancement from the reference c-Si. The results show that ZnO is the most effective ARC in improving light trapping and enhancing solar cell performance.
Metadata
| Item Type: | Book Section |
|---|---|
| Creators: | Creators Email / ID Num. Kamal, Nur A’inul Mardhiah UNSPECIFIED Mohmad Salleh, Siti Hajar UNSPECIFIED |
| Subjects: | H Social Sciences > HD Industries. Land use. Labor > Technological innovations T Technology > T Technology (General) > Industrial research. Research and development T Technology > T Technology (General) > Industrial engineering. Management engineering |
| Divisions: | Universiti Teknologi MARA, Negeri Sembilan |
| Page Range: | pp. 1-4 |
| Keywords: | Crystalline silicon, anti-reflective coating, ray tracing, simulation, solar cell efficiency |
| Date: | 2025 |
| URI: | https://ir.uitm.edu.my/id/eprint/143360 |
