The effect of drying temperature and time on the electrical, dielectric and structural properties of magnesium oxide thin film

This project presents the effect of drying temperature and time on the properties of MgO thin films. The glass substrate was used in order to prepare the MgO thin film. Sol-gel spin coating was used as the preparing method of MgO thin films. The electrical properties were determined by I-V two point probes measurement while the impedance spectroscopy analyzer was used to determine the dielectric properties. The structural properties were examined by field emission scanning electron microscope (FESEM) and atomic force microscopy (AFM). The I-V results indicate that the positive voltage applied leads to the formation of ohmic contact due to linearly increase of current. It was found that increasing the drying temperatures and times resulted in the formation of bigger grain size and increasing of thin film resistivity.